Dr. Christian Gruenzweig
at Paul Scherrer Institut
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 September 2008 Paper
T. Donath, F. Pfeiffer, O. Bunk, W. Groot, M. Bednarzik, C. Grünzweig, E. Hempel, S. Popescu, M. Hoheisel, C. David
Proceedings Volume 7078, 707817 (2008) https://doi.org/10.1117/12.794699
KEYWORDS: X-rays, Interferometers, X-ray imaging, Tomography, Refractive index, Signal attenuation, X-ray computed tomography, Phase measurement, X-ray sources, X-ray detectors

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