Prof. Christian Rembe
Division Manager at Technische Univ. Clausthal
SPIE Involvement:
Conference Program Committee | Author
Publications (32)

Proceedings Article | 3 October 2022 Paper
Proceedings Volume 12223, 1222302 (2022) https://doi.org/10.1117/12.2633313
KEYWORDS: Laser Doppler velocimetry, Heterodyning, Microscopes, Interferometers, Sensors, Optical testing, Interferometry, Confocal microscopy, Objectives, Stars

Proceedings Article | 20 June 2021 Presentation + Paper
Proceedings Volume 11782, 117820E (2021) https://doi.org/10.1117/12.2592048
KEYWORDS: Laser Doppler velocimetry, Vibrometry, Light scattering, Speckle, Signal processing, Sensors, Reliability, Polarization, Head, Doppler effect

SPIE Journal Paper | 7 August 2019 Open Access
OE, Vol. 58, Issue 08, 087101, (August 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.8.087101
KEYWORDS: Microlens, Microlens array, Mirrors, Objectives, Distance measurement, Laser scanners, Scanners, Prisms, Spatial resolution, Optical engineering

Proceedings Article | 11 April 2019 Presentation + Paper
Proceedings Volume 11028, 1102804 (2019) https://doi.org/10.1117/12.2520351
KEYWORDS: Mirrors, Scanners, Distance measurement, Laser scanners, Objectives, LIDAR, Spatial resolution, 3D scanning, Sensors, Optical components

Proceedings Article | 17 September 2018 Presentation
Proceedings Volume 10726, 107260V (2018) https://doi.org/10.1117/12.2324481
KEYWORDS: Microscopy, Modulation, Super resolution, Absorbance, Confocal microscopy, Diffraction, Optical lithography, Molecules, Opacity, Dielectrics

Showing 5 of 32 publications
Conference Committee Involvement (13)
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Showing 5 of 13 Conference Committees
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