Dr. Christine Borel
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 20 September 2007 Paper
Proc. SPIE. 6705, Advances in X-Ray/EUV Optics and Components II
KEYWORDS: Multilayers, Data modeling, Argon, Sputter deposition, X-rays, Ions, Reflectivity, Solids, Aluminum, Deposition processes

Proceedings Article | 11 September 2006 Paper
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Multilayers, Data modeling, Metals, Annealing, X-rays, Interfaces, Coating, Reflectivity, Solids, Ruthenium

Proceedings Article | 29 August 2006 Paper
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Diffraction, Mirrors, Multilayers, X-ray optics, Reflection, X-rays, Coating, Reflectivity, Refraction, Synchrotrons

Proceedings Article | 31 August 2005 Paper
Proc. SPIE. 5918, Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II
KEYWORDS: Multilayers, Data modeling, Annealing, X-rays, Interfaces, Reflectivity, Heat treatments, Synchrotrons, Synchrotron radiation, Ruthenium

Proceedings Article | 3 November 2004 Paper
Proc. SPIE. 5537, X-Ray Sources and Optics
KEYWORDS: Mirrors, Multilayers, X-ray optics, Reflection, X-rays, Reflectivity, Solids, Synchrotrons, Data centers, Ruthenium

Showing 5 of 7 publications
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