Prof. Christophe Gorecki
SPIE Involvement:
Author | Editor | Student Chapter Advisor
Publications (96)

Proceedings Article | 1 March 2019 Presentation + Paper
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Metrology, Clocks, Glasses, Silicon, Atomic clocks, Vertical cavity surface emitting lasers, Neon, Microfabrication, Cesium, Semiconducting wafers

Proceedings Article | 7 September 2018 Paper
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Microelectromechanical systems, GRIN lenses, Mirau interferometers, Optical coherence tomography, Glasses, Scanners, Interferometry, Objectives, Microopto electromechanical systems, Endomicroscopy

Proceedings Article | 24 May 2018 Paper
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Fabrication, Axicons, Glasses, Silicon, Microlens, Bessel beams, Micromachining, Microfabrication, Semiconducting wafers, Wafer bonding

Proceedings Article | 24 May 2018 Presentation + Paper
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Microelectromechanical systems, GRIN lenses, Cancer, Optical coherence tomography, Glasses, Scanners, Microopto electromechanical systems, Micromirrors, Endomicroscopy, Stomach

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical spheres, Digital holography, Reflection, Microscopy, Microlens, Aspheric lenses, Reconstruction algorithms, Spherical lenses

Showing 5 of 96 publications
Proceedings Volume Editor (23)

SPIE Conference Volume | 9 August 2018

SPIE Conference Volume | 6 June 2016

SPIE Conference Volume | 16 July 2014

SPIE Conference Volume | 29 May 2014

SPIE Conference Volume | 13 September 2012

Showing 5 of 23 publications
Conference Committee Involvement (35)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Showing 5 of 35 Conference Committees
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