Christopher Nafis
at GE Research
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 14 May 2015 Paper
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Cameras, Sensors, Glasses, Composites, Manufacturing, Head, Light sources and illumination, Neodymium, Tolerancing, Structured light

Proceedings Article | 14 September 2011 Paper
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Infrared imaging, Sensors, Crystals, Ions, Inspection, Wafer inspection, Associative arrays, Neodymium, Semiconducting wafers, 3D image processing

Proceedings Article | 3 September 2010 Paper
Proc. SPIE. 7793, Optical System Alignment, Tolerancing, and Verification IV
KEYWORDS: Near infrared, Imaging systems, Cameras, Sensors, Light scattering, Manufacturing, Inspection, Light sources and illumination, Semiconducting wafers, Tellurium

Proceedings Article | 3 September 2010 Paper
Proc. SPIE. 7806, Penetrating Radiation Systems and Applications XI
KEYWORDS: Infrared imaging, Sensors, Ultrasonography, Image segmentation, Image processing, Crystals, Inspection, Laser cutting, Semiconducting wafers, 3D image processing

Proceedings Article | 14 April 2010 Paper
Proc. SPIE. 7667, Biometric Technology for Human Identification VII
KEYWORDS: Image fusion, Refractive index, Data modeling, Polarization, Cameras, Sensors, 3D modeling, Image registration, Liquid crystals, 3D image processing

Showing 5 of 12 publications
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