Dr. Chu-Shik Kang
Principal Researcher at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 5 June 2013 Paper
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Spectroscopy, Silicon, Fourier transforms, Geometrical optics, Semiconducting wafers, Pulsed laser operation

Proceedings Article | 5 June 2013 Paper
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Silicon, Reliability, Semiconductor lasers, Phase measurement, Semiconducting wafers, Pulsed laser operation

SPIE Journal Paper | 1 May 2011
OE Vol. 50 Issue 05
KEYWORDS: Calibration, Laser stabilization, Interferometers, Helium neon lasers, Iodine cells, Data acquisition, Manufacturing, Optical engineering, Precision calibration, Neon

Proceedings Article | 14 May 2010 Paper
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Optical components, Microscopes, Monochromatic aberrations, Point spread functions, Sensors, Calibration, Computer simulations, 3D metrology, Cylindrical lenses, Cerium

Proceedings Article | 17 June 2009 Paper
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Confocal microscopy, Light sources, Phase shifting, Interferometers, Calibration, Interferometry, Phase interferometry, Semiconductor lasers, Laser stabilization, Phase shifts

Showing 5 of 15 publications
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