Prof. Chun Jung Lai
at National Taipei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 September 2011 Paper
Proceedings Volume 8104, 810417 (2011) https://doi.org/10.1117/12.894331
KEYWORDS: Thin films, Birefringence, Polarization, Refractive index, Optical properties, Fabrication, Prisms, Reflectivity, Scanning electron microscopy, Wave plates

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