Dr. Chung Wah See Profile

Dr. Chung Wah See

Associate Professor at Univ of Nottingham

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Author

Publications (10)

Proceedings Article | 5 April 2007 Paper

Line width measurement below 60nm using an optical interferometer and artificial neural network

Chung W. See, Richard Smith, Michael Somekh, Andrew Yacoot

Proceedings Volume 6518, 65181F (2007) https://doi.org/10.1117/12.712278

KEYWORDS: Signal to noise ratio, Interferometers, Principal component analysis, Artificial neural networks, Photons, Point spread functions, Classification systems, Optical testing, Critical dimension metrology, Optical resolution

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Proceedings Article | 29 August 2005 Paper

Sub-0.1µm optical track width measurement

Richard Smith, Chung See, Mike Somekh, Andrew Yacoot

Proceedings Volume 5858, 58580M (2005) https://doi.org/10.1117/12.611999

KEYWORDS: Interferometers, Artificial neural networks, Optical tracking, Objectives, Signal to noise ratio, Fourier transforms, Optical testing, Optical networks, Signal processing, Optical microscopes

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Proceedings Article | 19 November 2003 Paper

Wide field, phase measuring confocal microscopy of small particles

N. Sawyer, Stephen Morgan, Michael Somekh, Chung Wah See, B. Shekunov, E. Astrakharchik

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.529191

KEYWORDS: Particles, Microscopes, Confocal microscopy, Phase shifts, Speckle pattern, Diffraction, Mie scattering, Interferometers, Phase measurement, Light scattering

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Proceedings Article | 13 October 2003 Paper

Imaging of small particles using wide-field confocal microscopy

Stephen Morgan, N. Sawyer, Michael Somekh, Chung Wah See, B. Shekunov, E. Astrakharchik

Proceedings Volume 5068, (2003) https://doi.org/10.1117/12.518774

KEYWORDS: Particles, Confocal microscopy, Microscopes, Diffraction, Speckle pattern, Mie scattering, Imaging systems, Polarization, Atmospheric modeling, Atmospheric particles

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Proceedings Article | 5 April 2001 Paper

Design and characterization of an optical VLSI processor for real-time centroid detection

Boon Pui, Barrie Hayes-Gill, Matt Clark, Michael Somekh, Chung Wah See, Jean-Francois Pieri, Stephen Morgan, Alan Ng

Proceedings Volume 4408, (2001) https://doi.org/10.1117/12.425338

KEYWORDS: Photodiodes, Field programmable gate arrays, Photodetectors, Wavefront sensors, Sensors, Computer aided design, Wavefronts, Integrated optics, CMOS sensors, Integrated circuit design

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Proceedings Article | 18 September 1996 Paper

Differential optical profilometer using a single-probe beam

N. Sawyer, Chung See, Michael Somekh

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250795

KEYWORDS: Profilometers, Sensors, Heterodyning, Phase interferometry, Interferometers, Laser beam diagnostics, Image sensors

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Proceedings Article | 18 September 1996 Paper

Common path interferometric microellipsometry

Yueai Liu, Chung See, Michael Somekh

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250794

KEYWORDS: Interferometry, Phase measurement, Reflection, Polarization, Phase shifts, Fringe analysis, Refractive index, Optical testing

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Proceedings Article | 10 May 1996 Paper

Novel fast laser scanning heterodyne differential-phase/fluorescence confocal microscopes for imaging live biological samples

John Garside, Michael Somekh, Chung See

Proceedings Volume 2678, (1996) https://doi.org/10.1117/12.239548

KEYWORDS: Sensors, Confocal microscopy, Beam splitters, Heterodyning, Microscopes, Luminescence, Bragg cells, Laser beam diagnostics, Reflection, Signal detection

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Proceedings Article | 31 January 1995 Paper

Single-source phased array for imaging through scattering media

Stephen Morgan, Chung See, Michael Somekh

Proceedings Volume 2326, (1995) https://doi.org/10.1117/12.200810

KEYWORDS: Modulation, Scattering, Interferometers, Scattering media, Bragg cells, Phased arrays, Imaging arrays, Light scattering, Signal detection, Sensors

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Proceedings Article | 1 February 1994 Paper

Confocal operation in differential phase interference microscopy

Michael Somekh, R. Holmes, Roland Appel, Chung Wah See

Proceedings Volume 2083, (1994) https://doi.org/10.1117/12.167432

KEYWORDS: Confocal microscopy, Microscopes, Imaging systems, Heterodyning, Line scan image sensors, Phase imaging, Interferometers, Phase measurement, Signal detection, Objectives

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Showing 5 of 10 publications

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