Claudio Biagini
at Istituto Italiano di Tecnologia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2019 Presentation
Proceedings Volume 10926, 109260M (2019) https://doi.org/10.1117/12.2510474
KEYWORDS: Atomic force microscopy, Optical resolution, Optical microscopy, Microscopy, Sensors, Objectives, Diffraction, Super resolution, Optical components, Nanolithography

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