Craig L. Ghelli
Outside Services Engineer
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 4 May 2005 Paper
Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.598819
KEYWORDS: Semiconducting wafers, Diffractive optical elements, Photoresist materials, Photoresist developing, Particles, Optical lithography, Coating, Control systems, Liquids, Wafer testing

Proceedings Article | 12 June 2003 Paper
Chris Cox, Darron Dippel, Craig Ghelli, Pasquale Valerio, William Simmons, Alice Guerrero
Proceedings Volume 5039, (2003) https://doi.org/10.1117/12.483708
KEYWORDS: Photoresist developing, Photoresist materials, Etching, Plasma etching, Semiconducting wafers, Lithography, Plasma, Optical lithography, Scanning electron microscopy, Dry etching

Proceedings Article | 25 June 1999 Paper
Proceedings Volume 3676, (1999) https://doi.org/10.1117/12.351117
KEYWORDS: Metals, Extreme ultraviolet lithography, Antireflective coatings, Silicon, Lithography, Charged-particle lithography, Mask making, Photomasks, Semiconducting wafers, Scanning electron microscopy

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