Daisaku Mochida
at Nikon Tsubasa Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 24 March 2008 Paper
Proceedings Volume 6922, 69221X (2008) https://doi.org/10.1117/12.771889
KEYWORDS: Critical dimension metrology, Semiconducting wafers, Inspection, Birefringence, Polarization, Polarizers, Scanning electron microscopy, Objectives, Edge roughness, Data modeling

Proceedings Article | 29 June 2006 Paper
Masahiko Kimura, Toshinori Maihara, Fumihide Iwamuro, Shigeru Eto, Masayuki Akiyama, Kouji Ohta, Michinari Sakai, Naoyuki Tamura, Daisaku Mochida
Proceedings Volume 6269, 626944 (2006) https://doi.org/10.1117/12.670705
KEYWORDS: Telescopes, Mirrors, Spectrographs, Astronomical imaging, Electroluminescence, Stars, Monochromatic aberrations, CCD cameras, Imaging systems, Astronomy

Proceedings Article | 30 September 2004 Paper
Shigeru Eto, Toshinori Maihara, Kouji Ohta, Fumihide Iwamuro, Masahiko Kimura, Daisaku Mochida, Shinpei Wada, Satoko Imai, Yusuke Narita, Yu Nakajima, Hiroshi Karoji, Jun'ichi Noumaru, Masayuki Akiyama, Peter Gillingham, Scott Smedley, Naoyuki Tamura
Proceedings Volume 5492, (2004) https://doi.org/10.1117/12.551087
KEYWORDS: Spectrographs, Telescopes, Control systems, Sensors, Astronomical imaging, Control systems design, Imaging systems, Cameras, Computing systems, Infrared radiation

Proceedings Article | 7 March 2003 Paper
Proceedings Volume 4841, (2003) https://doi.org/10.1117/12.461208
KEYWORDS: Spectrographs, Cameras, Telescopes, Silica, Mirrors, Connectors, Spine, Spectral resolution, Imaging systems, Astronomical imaging

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