Mr. Dam-Bé Lardja Douti Profile

Dam-Bé Lardja Douti

at Institut Fresnel

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Author

Publications (6)

Proceedings Article | 23 November 2015 Paper

Analysis of energy deposition and damage mechanisms in single layers of HfO2 and Nb2O5 submitted to 500fs pulses

Dam-Bé Douti, Mahmad Chrayteh, Serge Monneret, Mireille Commandré, Laurent Gallais

Proceedings Volume 9632, 96320L (2015) https://doi.org/10.1117/12.2195005

KEYWORDS: Thin film coatings, Laser induced damage, Thin films, Optics manufacturing, Optical coatings, Laser optics, Laser development, Femtosecond phenomena, Laser systems engineering, Electrons, Ionization, Ultraviolet radiation, Interfaces, Optical properties, Absorption, Laser damage threshold, Scanning electron microscopy

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Proceedings Article | 2 October 2015 Paper

Analysis of energy deposition and damage mechanisms in single layer optical thin films irradiated by IR and UV femtosecond pulses

Dam Bé Douti, Laurent Gallais, Christophe Hecquet, Thomas Bégou, Julien Lumeau, Mireille Commandré

Proceedings Volume 9627, 962718 (2015) https://doi.org/10.1117/12.2192983

KEYWORDS: Thin films, Ultraviolet radiation, Laser damage threshold, Laser induced damage, Absorption, Silica, Ions, Ionization, UV optics, Femtosecond phenomena

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Proceedings Article | 14 July 2015 Paper

Laser damage measurement techniques for the femtosecond regime

D.-B. Douti, M. Chrayteh, A. Melninkaitis, S. Monneret, M. Commandré, L. Gallais

Proceedings Volume 9532, 953219 (2015) https://doi.org/10.1117/12.2185775

KEYWORDS: Laser induced damage, Microscopy, Microscopes, Cameras, Femtosecond phenomena, Phase imaging, Image processing, Laser damage threshold, Optical microscopy, Sensors

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Proceedings Article | 31 October 2014 Paper

In-line quantitative phase imaging for damage detection and analysis

Dam-Bé Douti, Sherazade Aknoun, Serge Monneret, Christophe Hecquet, Mireille Commandré, Laurent Gallais

Proceedings Volume 9237, 92371A (2014) https://doi.org/10.1117/12.2068178

KEYWORDS: Digital image correlation, Cameras, Laser induced damage, Phase imaging, Sensors, Laser damage threshold, Microscopes, Damage detection, Interferometry, Refractive index

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Proceedings Article | 31 October 2014 Paper

UV to IR laser damage of Magnetron Sputtering films submitted to multiple sub-picosecond pulses

Dam-Bé Douti, Christophe Hecquet, Thomas Bégou, Mireille Commandré, Laurent Gallais

Proceedings Volume 9237, 92370I (2014) https://doi.org/10.1117/12.2068176

KEYWORDS: Silica, Sputter deposition, Ultraviolet radiation, Laser induced damage, Refractive index, Laser damage threshold, Infrared lasers, Thin films, Neodymium, Plasma

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SPIE Journal Paper | 6 August 2014

Laser-induced damage of optical thin films submitted to 343, 515, and 1030 nm multiple subpicosecond pulses

Dam-Bé Douti, Laurent Gallais, Mireille Commandré

OE, Vol. 53, Issue 12, 122509, (August 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122509

KEYWORDS: Thin films, Laser induced damage, Silica, Hybrid fiber optics, Ultraviolet radiation, Laser optics, Laser damage threshold, Absorption, Optical engineering, Niobium

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Showing 5 of 6 publications

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