Dr. Dan-Cristian Dinca Profile

Dr. Dan-Cristian Dinca

Staff Scientist at American Science and Engineering Inc

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Proceedings Article | 25 April 2008 Paper

X-ray backscatter imaging

Dan-Cristian Dinca, Jeffrey Schubert, J. Callerame

Proceedings Volume 6945, 694516 (2008) https://doi.org/10.1117/12.773334

KEYWORDS: Backscatter, X-rays, X-ray imaging, Inspection, Sensors, Image transmission, Image quality, Multiplexing, X-ray detectors, Photons

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In contrast to transmission X-ray imaging systems where inspected objects must pass between source and detector, Compton backscatter imaging allows both the illuminating source as well as the X-ray detector to be on the same side of the target object, enabling the inspection to occur rapidly and in a wide variety of space-constrained situations. A Compton backscatter image is similar to a photograph of the contents of a closed container, taken through the container walls, and highlights low atomic number materials such as explosives, drugs, and alcohol, which appear as especially bright objects by virtue of their scattering characteristics. Techniques for producing X-ray images based on Compton scattering will be discussed, along with examples of how these systems are used for both novel security applications and for the detection of contraband materials at ports and borders. Differences between transmission and backscatter images will also be highlighted. In addition, tradeoffs between Compton backscatter image quality and scan speed, effective penetration, and X-ray source specifications will be discussed.

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