Daniel E. Green
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 November 1999 Paper
Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369224
KEYWORDS: Polishing, Silica, Wavefronts, Surface finishing, Interferometers, Reflection, Time metrology, Refraction, National Ignition Facility, Interferometry

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