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Dr. Daniel S. Green
Technical Manager at Qorvo Inc
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Author
Publications (1)
Proceedings Article | 6 February 2008 Paper
Status of GaN HEMT performance and reliability
Daniel Green, J. Brown, R. Vetury, S. Lee, S. Gibb, K. Krishnamurthy, M. Poulton, J. Martin, J. Shealy
Proceedings Volume 6894, 68941M (2008) https://doi.org/10.1117/12.763781
KEYWORDS: Gallium nitride, Field effect transistors, Reliability, Amplifiers, Transistors, Semiconducting wafers, Temperature metrology, Silicon carbide, Resistance, Switches
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