Dr. Daniel Koutny
at Brno Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 August 2023 Poster + Paper
Proceedings Volume 12618, 126181V (2023) https://doi.org/10.1117/12.2673399
KEYWORDS: Error analysis, Optical filters, Temperature metrology, Cameras, Bandpass filters, Visible radiation, Calibration, Near infrared, Spatial frequencies, Feature extraction

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