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Danielle Dekker
at cosine measurement systems
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Publications (3)
Proceedings Article | 21 September 2017 Paper
Predicting silicon pore optics
Giuseppe Vacanti, Nicolas Barriére, Marcos Bavdaz, Abdelhakim Chatbi, Maximilien Collon, Danielle Dekker, David Girou, Ramses Günther, Roy van der Hoeven, Boris Landgraf, Jessica Sforzini, Mark Vervest, Eric Wille
Proceedings Volume 10399, 103990M (2017) https://doi.org/10.1117/12.2274309
KEYWORDS: Optics manufacturing, Metrology, Silicon, Geometrical optics, X-ray optics, Monte Carlo methods, Ray tracing, Performance modeling, X-rays, Standards development
Proceedings Article | 8 September 2017 Paper
Measuring silicon pore optics
Giuseppe Vacanti, Nicolas Barrière, Marcos Bavdaz, Abdelhakim Chatbi, Maximilien Collon, Daniëlle Dekker, David Girou, Ramses Günther, Roy van der Hoeven, Michael Krumrey, Boris Landgraf, Peter Müller, Swenja Schreiber, Mark Vervest, Eric Wille
Proceedings Volume 10399, 103990N (2017) https://doi.org/10.1117/12.2274357
KEYWORDS: X-rays, X-ray optics, Optics manufacturing, Metrology, Silicon, Sensors, X-ray characterization, X-ray detectors, Geometrical optics, Algorithm development
Proceedings Article | 29 August 2017 Presentation + Paper
Development of ATHENA mirror modules
Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Roy van der Hoeven, Danielle Dekker, Abdel Chatbi, David Girou, Jessica Sforzini, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Finn Christensen, Desirée Della Monica Ferreira, Giuseppe Valsecchi, Paul Oliver, Ian Checquer, Kevin Ball, Karl-Heinz Zuknik
Proceedings Volume 10399, 103990C (2017) https://doi.org/10.1117/12.2273704
KEYWORDS: Mirrors, X-ray optics, Silicon, Optics manufacturing, Wafer-level optics, X-ray astronomy, Semiconducting wafers, Astronomical imaging, X-ray telescopes, Spatial resolution
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