Ms. Danielle Dekker Profile

Danielle Dekker

at cosine BV

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Author

Publications (3)

Proceedings Article | 21 September 2017 Paper

Predicting silicon pore optics

Giuseppe Vacanti, Nicolas Barriére, Marcos Bavdaz, Abdelhakim Chatbi, Maximilien Collon, Danielle Dekker, David Girou, Ramses Günther, Roy van der Hoeven, Boris Landgraf, Jessica Sforzini, Mark Vervest, Eric Wille

Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII

KEYWORDS: X-ray optics, Metrology, X-rays, Silicon, Monte Carlo methods, Ray tracing, Geometrical optics, Optics manufacturing, Performance modeling, Standards development

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Proceedings Article | 8 September 2017 Paper

Measuring silicon pore optics

Giuseppe Vacanti, Nicolas Barrière, Marcos Bavdaz, Abdelhakim Chatbi, Maximilien Collon, Daniëlle Dekker, David Girou, Ramses Günther, Roy van der Hoeven, Michael Krumrey, Boris Landgraf, Peter Müller, Swenja Schreiber, Mark Vervest, Eric Wille

Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII

KEYWORDS: X-ray optics, Metrology, Sensors, X-rays, Silicon, Geometrical optics, Algorithm development, X-ray detectors, Optics manufacturing, X-ray characterization

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Proceedings Article | 29 August 2017 Presentation + Paper

Development of ATHENA mirror modules

Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Roy van der Hoeven, Danielle Dekker, Abdel Chatbi, David Girou, Jessica Sforzini, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Finn Christensen, Desirée Della Monica Ferreira, Giuseppe Valsecchi, Paul Oliver, Ian Checquer, Kevin Ball, Karl-Heinz Zuknik

Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII

KEYWORDS: Wafer-level optics, Mirrors, X-ray optics, Silicon, Spatial resolution, Astronomical imaging, X-ray astronomy, X-ray telescopes, Semiconducting wafers, Optics manufacturing

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