Dr. Daron Westly
Research Scientist at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 March 2020 Presentation
Proc. SPIE. 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
KEYWORDS: Microresonators, Waveguides, Spectroscopy, Free space, Laser stabilization, Dimensional metrology, Free space optics, Aluminum nitride, Integrated optics, Rubidium

Proceedings Article | 14 March 2018 Presentation
Proc. SPIE. 10548, Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
KEYWORDS: Optical fibers, Diffraction, Metrology, Waveguides, Spectroscopy, Free space, Collimation, Photonic integrated circuits, Diffraction gratings

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