Dr. David L. Aronstein
Optical Engineer at Corning Inc
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 10 October 2019 Presentation + Paper
Proc. SPIE. 11148, Photomask Technology 2019
KEYWORDS: Reticles, Polishing, Optical lithography, Scanners, Computer simulations, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, Semiconducting wafers, Surface finishing

Proceedings Article | 27 June 2019 Paper
Proc. SPIE. 11178, Photomask Japan 2019: XXVI Symposium on Photomask and Next-Generation Lithography Mask Technology
KEYWORDS: Photovoltaics, Polishing, Metrology, Optical lithography, Spatial frequencies, Scanners, Distortion, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Deep ultraviolet, Silica, Polarization, Birefringence, Sensors, Crystals, Polarimetry, Objectives, Thin film coatings, Nanolithography

Proceedings Article | 18 October 2016 Paper
Proc. SPIE. 9951, Optical System Alignment, Tolerancing, and Verification X
KEYWORDS: Mirrors, Metrology, Calibration, Interfaces, Finite element methods, Optical alignment, Computer aided design, James Webb Space Telescope, Cryogenics, Virtual colonoscopy

Proceedings Article | 27 September 2016 Presentation + Paper
Proc. SPIE. 9951, Optical System Alignment, Tolerancing, and Verification X
KEYWORDS: Human-machine interfaces, Optical components, Data modeling, Sensors, Calibration, Error analysis, Optical testing, Space telescopes, Analytical research, James Webb Space Telescope

Showing 5 of 19 publications
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