We describe the verification of a long-range one-dimensional (1D) scanning micro-electro-mechanical systems (MEMS) lidar specifically considering the robustness against external vibration influences. The 1D scanning MEMS lidar exploits a multichannel horizontal line laser to scan the scene vertically for a 10 deg × 11 deg horizontal and vertical field of view at a frame rate of up to 29 Hz. To evaluate the robustness against vibrations, a vibration evaluation setup is developed to apply a wideband vibration based on the automotive standard LV124. The vibration tests are performed in three conditions open loop without control and two phase-locked loops (PLLs) with default and high gain settings. The test results demonstrate that vibration can cause wobbly distortion along the scan angle in the open loop case and the PLLs can suppress effectively this influence in the mean and standard deviation of the standard point to surface error up to 69.3% and 90.0%, respectively. This verifies the benefits of the MEMS mirror control, ensuring stable point cloud measurements under vibrations in harsh automotive environments.
Accurate modeling of MOEMS mirrors is crucial for their design and fabrication, as well as for proper control within its target applications. This paper proposes a novel identification method using a generalized nonlinear SDOF model of an electrostatically actuated 1D resonant MOEMS mirror solely based on measured scanning trajectories and the current generated by the movement of the comb-drive electrodes. The nonlinear stiffness and damping are identified from a decay measurement while the comb-drive torque and the rotor inertia are derived from an actuated decay measurement, where a constant voltage is applied. The simulation with the identified parameters closely matches the measured frequency response including bifurcations and hysteresis. Furthermore a period-based modified index of agreement is proposed for nonlinear systems showing values of over 0.995 at each period along the decay.
PSDs are used for fast and precise beam position measurements in various applications such as scanner characterization and scanning probe microscopy. However, PSDs suffer from systematic position sensing errors at high temperatures, limiting the possible application fields for usage of PSDs. This paper investigates temperature dependency of PSDs and its compensation that enables the usability of PSDs in high temperature applications above 60°C. The proposed compensation scheme is explained by the diode leakage current model, which is extended to the given semiconductor device structure of the PSD. For the validation of the proposed method, an experimental PSD characterization setup has been used, showing that the proposed temperature compensation scheme reduces the temperature-induced relative position sensing error from 44.7 % down to 0.2 % for temperatures up to 95°C.
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