David K.T. Eu
President at InPhenix Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 14 July 2009 Paper
Lisa Li, Zhenghua Wu, Jinyan Jin, Weiming Zhu, David Eu
Proceedings Volume 7372, 73720L (2009) https://doi.org/10.1117/12.831817
KEYWORDS: Optical coherence tomography, Light sources, Quantum wells, Semiconductors, Image resolution, Imaging systems, Structural design, In vivo imaging, Reflectivity, Visualization

Proceedings Article | 19 November 2007 Paper
Tongning Li, Yibing Tang, Wenchao Xu, Qinian Qi, David Eu
Proceedings Volume 6782, 67820T (2007) https://doi.org/10.1117/12.754403
KEYWORDS: Light sources, Optical coherence tomography, Sensors, Imaging systems, Tunable lasers, Optical testing, Optical sensors, Fiber optics sensors, Optical components, Polarization

Proceedings Article | 1 July 2004 Paper
TongNing Li, Jingyi Wang, Yan Feng, Jinyan Jin, Weiming Zhu, Yibing Tang, Wenchao Xu, Tao Huang, David Eu
Proceedings Volume 5316, (2004) https://doi.org/10.1117/12.528537
KEYWORDS: Polarization, Quantum wells, Coherence (optics), Waveguides, Silicon films, Semiconducting wafers, Diodes, Antireflective coatings, Etching, Wet etching

Proceedings Article | 9 April 1993 Paper
David Eu, Godfried Toussaint
Proceedings Volume 1832, (1993) https://doi.org/10.1117/12.142160
KEYWORDS: Tolerancing, Image segmentation, Vision geometry, Data compression, Distance measurement, Computer programming, Radon, Molybdenum, Binary data, Algorithms

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