Dr. David Fleischle Profile

Dr. David Fleischle

at Univ Stuttgart

SPIE Involvement:

Author

Publications (7)

SPIE Journal Paper | 3 December 2020 Open Access

Detailed characterization of a mosaic based hyperspectral snapshot imager

Robin Hahn, Freya-Elin Hämmerling, Tobias Haist, David Fleischle, Oliver Schwanke, Otto Hauler, Karsten Rebner, Marc Brecht, Wolfgang Osten

OE, Vol. 59, Issue 12, 125102, (December 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.12.125102

KEYWORDS: Sensors, Imaging systems, Hyperspectral imaging, Cameras, Manufacturing, Optical filters, Optical engineering, Electronic filtering, Monochromators, Image sensors

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 1 April 2020 Presentation + Paper

Detailed characterization of a hyperspectral snapshot imager for full-field chromatic confocal microscopy

Robin Hahn, Tobias Haist, Freya-Elin Hämmerling, David Fleischle, Oliver Schwanke, Otto Hauler, Karsten Rebner, Marc Brecht, Wolfgang Osten

Proceedings Volume 11352, 113520Y (2020) https://doi.org/10.1117/12.2556797

KEYWORDS: Sensors, Optical filters, Cameras, Hyperspectral imaging, Confocal microscopy, Speckle, Colorimetry, Monochromators, 3D metrology, Hyperspectral sensing

Read Abstract +

Proceedings Article | 27 May 2011 Paper

Conceptual consideration for the process integration of optical sensors

David Fleischle, Wolfram Lyda, Florian Mauch, Wolfgang Osten

Proceedings Volume 8082, 808204 (2011) https://doi.org/10.1117/12.890027

KEYWORDS: Sensors, Signal processing, Environmental sensing, Optical sensors, Optical testing, Signal detection, Manufacturing, Process control, Liquids, Inspection

Read Abstract +

Proceedings Article | 23 May 2011 Paper

Combining rigorous diffraction calculation and GPU accelerated nonsequential raytracing for high precision simulation of a linear grating spectrometer

Florian Mauch, David Fleischle, Wolfram Lyda, Wolfgang Osten, Torsten Krug, Reto Häring

Proceedings Volume 8083, 80830F (2011) https://doi.org/10.1117/12.889175

KEYWORDS: Spectroscopy, Diffraction gratings, Ray tracing, Stray light, Diffraction, Computer simulations, Light emitting diodes, Monte Carlo methods, Light scattering, Scattering

Read Abstract +

Proceedings Article | 14 September 2010 Paper

Optical metrology: from the laboratory to the real world

W. Osten, E. Garbusi, D. Fleischle, W. Lyda, C. Pruss, R. Reichle, C. Falldorf

Proceedings Volume 7387, 73871G (2010) https://doi.org/10.1117/12.873356

KEYWORDS: Inspection, Optical metrology, Sensors, Aspheric lenses, Image processing, Interferometers, Shearography, Digital micromirror devices, Mirrors, Chemical elements

Read Abstract +

Proceedings Article | 14 May 2010 Paper

Optical metrology for process control: modeling and simulation of sensors for a comparison of different measurement principles

D. Fleischle, W. Lyda, F. Mauch, W. Osten

Proceedings Volume 7718, 77181D (2010) https://doi.org/10.1117/12.855053

KEYWORDS: Sensors, Interferometry, Confocal microscopy, Colorimetry, Process control, Control systems, Data modeling, Optical testing, Bidirectional reflectance transmission function, Manufacturing

Read Abstract +

Proceedings Article | 10 September 2009 Paper

Chromatic confocal spectral interferometry for technical surface characterization

W. Lyda, D. Fleischle, T. Haist, W. Osten

Proceedings Volume 7432, 74320Z (2009) https://doi.org/10.1117/12.826902

KEYWORDS: Sensors, Confocal microscopy, Interferometry, Colorimetry, Data modeling, Mirrors, Interferometers, Diffractive optical elements, Bidirectional reflectance transmission function, Wavelets

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years