Dr. David J. Gundlach Profile

Dr. David J. Gundlach

Supervisory Engineer at National Institute of Standards and Technology

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 19 September 2017 Presentation

Probing the origins of temperature dependence of charge transport in organic single crystal transistors (Conference Presentation)

Emily Bittle, Adam Biacchi, Lisa Fredin, Andrew Herzing, Thomas Allison, Angela Hight Walker, David Gundlach

Proceedings Volume 10365, 103650T (2017) https://doi.org/10.1117/12.2273700

KEYWORDS: Crystals, Organic semiconductors, Transistors, Physics, Dielectrics, Raman spectroscopy, Transmission electron microscopy, Temperature metrology, Semiconductors, Molecules

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Proceedings Article | 13 September 2007 Paper

Distinguishing between nonlinear channel transport and contact effects in organic FETs

L. Richter, B. Hamadani, D. Gundlach, M. Heeney, R. J. Kline, J. LeBoeuf, C. Richter, I. McCulloch

Proceedings Volume 6658, 66580V (2007) https://doi.org/10.1117/12.734433

KEYWORDS: Field effect transistors, Instrument modeling, Transistors, Polymers, Resistance, Data modeling, Semiconductors, Gold, Electrodes, Information operations

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Proceedings Article | 20 September 2005 Paper

n-channel organic thin film transistors and complementary inverters

S. Haas, D. Gundlach, G. Wilckens, B. Batlogg, M. Grüter, K. Pernstich

Proceedings Volume 5940, 59400O (2005) https://doi.org/10.1117/12.615897

KEYWORDS: Gold, Chromium, Aluminum, Transistors, Metals, Thin films, Silicon, Semiconducting wafers, Semiconductors, Organic semiconductors

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Proceedings Article | 18 October 2004 Paper

Modeling and parameter extraction on pentacene TFTs

David Gundlach, Daniel Oberhoff, Kurt Pernstich, Bertram Batlogg

Proceedings Volume 5522, (2004) https://doi.org/10.1117/12.559789

KEYWORDS: Instrument modeling, Field effect transistors, Interfaces, Data modeling, Silica, Crystals, Resistance, Transistors, Silicon, Semiconducting wafers

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Proceedings Article | 21 December 2001 Paper

Improved organic thin film transistor performance using chemically modified gate dielectrics

David Gundlach, Chris Sheraw, Jonathan Nichols, Chung-Chen Kuo, Thomas Jackson

Proceedings Volume 4466, (2001) https://doi.org/10.1117/12.451466

KEYWORDS: Dielectrics, Silicon, Silica, Silicon films, Thin films, Organic semiconductors, Transistors, Electronics, Atomic force microscopy, Polymers

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