David E. Mohring
Metrology Coordinator at OptiPro Systems LLC
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 13 May 2019 Presentation + Paper
Proc. SPIE. 10985, Window and Dome Technologies and Materials XVI
KEYWORDS: Optical components, Polishing, Metrology, Manufacturing, Ultrasonics, Domes, Computer aided design, Freeform optics, Optics manufacturing, Surface finishing

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8016, Window and Dome Technologies and Materials XII
KEYWORDS: Polishing, Optical sensors, Optical spheres, Clouds, Optical testing, Aspheric lenses, Computer aided design, Freeform optics, Optics manufacturing, Surface finishing

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8016, Window and Dome Technologies and Materials XII
KEYWORDS: Polishing, Polyurethane, Metrology, Polishing equipment, Glasses, Manufacturing, Aspheric lenses, Aerodynamics, Prototyping, Surface finishing

Proceedings Article | 28 April 2009 Paper
Proc. SPIE. 7302, Window and Dome Technologies and Materials XI
KEYWORDS: Polishing, Principal component analysis, Surface roughness, Computing systems, Control systems, Aspheric lenses, Infrared radiation, Abrasives, Surface finishing, Plano

Proceedings Article | 28 April 2009 Paper
Proc. SPIE. 7302, Window and Dome Technologies and Materials XI
KEYWORDS: Metrology, Calibration, Computing systems, Transmission electron microscopy, Domes, Finite element methods, Aspheric lenses, Motion measurement, Tolerancing, Prototyping

Showing 5 of 9 publications
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