David Veyrié
at Ctr National d'Études Spatiales
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 July 2023 Open Access Paper
M. Boutillier, K. Mathieu, S. Petit-Poupart, C. Virmontois, E. Cucchetti, A. Delahaye, V. Lalucaa, D. Veyrié, M. Hubert, V. Sauget, S. Tisserand
Proceedings Volume 12777, 127776R (2023) https://doi.org/10.1117/12.2691353
KEYWORDS: Tunable filters, Optical filters, Spectral response, Astronomical imaging, Quantum efficiency, Visual inspection, Matrices, Interpolation, Incident light, Crosstalk

Proceedings Article | 12 July 2019 Open Access Paper
A. Mottet, S. Jillard, J. Hauden, N. Grossard, H. Porte, J. Tchahame, D. Veyrié, O. Gilard
Proceedings Volume 11180, 111803K (2019) https://doi.org/10.1117/12.2536047
KEYWORDS: Modulators, Optical fibers, Packaging, Electro optics, Helium, Climatology, Manufacturing, Electrooptic modulators, Space operations, Contamination

Proceedings Article | 5 February 2010 Paper
Djemel Lellouchi, Jérémie Dhennin, Xavier Lafontan, David Veyrie, Adrien Broue, Jean-François Le Neal, Francis Pressecq
Proceedings Volume 7592, 759203 (2010) https://doi.org/10.1117/12.839860
KEYWORDS: Helium, NOx, Microelectromechanical systems, FT-IR spectroscopy, Absorption, Spectroscopy, Infrared spectroscopy, Optical testing, Silicon, Packaging

Proceedings Article | 6 January 2006 Paper
D. Veyrié, J.-L. Roux, F. Pressecq, A. Tetelin, C. Pellet
Proceedings Volume 6111, 61110R (2006) https://doi.org/10.1117/12.646001
KEYWORDS: Absorption, Coating, Silicon, Semiconducting wafers, Microelectromechanical systems, FT-IR spectroscopy, Infrared spectroscopy, Infrared radiation, Nitrous oxide, Spectroscopy

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