Dr. Dawei Tang Profile

Dr. Dawei Tang

Senior Research Fellow at Univ of Huddersfield

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Author

Publications (5)

Proceedings Article | 27 November 2023 Paper

Single-shot dispersive interferometry for inline surface inspection

Dawei Tang, Jian Wang, Tianqi Gu, Hussam Muhamedsalih, Tong Guo, Xiangqian Jiang

Proceedings Volume 12769, 127690T (2023) https://doi.org/10.1117/12.2687322

KEYWORDS: Optical interferometry, Metrology, Interferometry, Interferograms, Spectral calibration, Fringe analysis, Interferometers, Inspection, Cameras, Calibration

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Proceedings Article | 25 April 2023 Presentation + Paper

In-process surface metrology for thin film flexible electronic devices

Liam Blunt, Hussam Muhamedsalih, Mothana Hassan, David Bird, Dan Kolb, Prashant Kumar, Dawei Tang, James Williamson

Proceedings Volume 12490, 1249007 (2023) https://doi.org/10.1117/12.2657501

KEYWORDS: Printing, Metrology, Manufacturing, Phase shifts, Optical surfaces, Interferometers, Interferograms, Flexible circuits, Thin films, Interferometry

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Proceedings Article | 27 January 2023 Paper

Transparent anisotropic films measurement with a polarized angle-resolved spectroscopy

Lihua Peng, Dawei Tang, Jian Wang, Long Xu, Wenlong Lu, Rong Chen, Liping Zhou

Proceedings Volume 12550, 1255024 (2023) https://doi.org/10.1117/12.2666965

KEYWORDS: Reflectivity, Refractive index, Spectroscopy, Reflection, Reflectometry, Optics, Optical coherence, Objectives

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Proceedings Article | 15 February 2022 Paper

Robust curve and surface reconstruction method based on clustering algorithm

Tianqi Gu, Hongxin Lin, Jianxiong Chen, Dawei Tang

Proceedings Volume 12166, 121661W (2022) https://doi.org/10.1117/12.2613544

KEYWORDS: Reconstruction algorithms, Calibration, Data processing, Spherical lenses, Reverse engineering, Mechanical engineering, Matrices, Interferometers, Analytical research, Algorithms

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Proceedings Article | 24 July 2018 Paper

Phase retrieval algorithm for line-scan dispersive interferometry

Dawei Tang, Prashant Kumar, Feng Gao, Xiangqian Jiang

Proceedings Volume 10827, 108270F (2018) https://doi.org/10.1117/12.2500918

KEYWORDS: Interferometry, Phase retrieval, Metrology, Fringe analysis, Light sources, Phase shifting, Fourier transforms, Interferometers

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