Dr. Zhai Dede Profile

Dr. Zhai Dede

at National Univ of Defense Technology

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Author

Publications (5)

Proceedings Article | 21 March 2023 Paper

Design of a wide-angle, ultra-thin planar two-dimensional geometrical waveguide combiner

Ningye Ruan, Feng Shi, Ci Song, Ye Tian, Xing Peng, Zhai Dede

Proceedings Volume 12595, 1259528 (2023) https://doi.org/10.1117/12.2669068

KEYWORDS: Waveguides, Design and modelling, Planar waveguides, Mirrors, Light wave propagation, Reflection, Projection systems, Mirror surfaces, Discontinuities, Near eye displays, Augmented reality

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Proceedings Article | 9 January 2023 Paper

High-resolution white light scanning stitching measurement of microstructure

Jingyang Guo, Dede Zhai, Shanyong Chen, Wenwen Lu

Proceedings Volume 12507, 125072U (2023) https://doi.org/10.1117/12.2656927

KEYWORDS: Edge detection, Spherical lenses, Interferometers, Microscopes, Computer generated holography, Optical testing, Motion measurement, Microscopy, Computer simulations, Optical interferometry

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With the development of ultra-precision machining technology, parts with microstructures on the surface are playing an increasingly important role in engineering practice. The scanning interference microscope measurement method is widely used in the measurement of microscopic surface topography. This paper proposes a method of interference microscopy combined with subaperture stitching. The first step is to divide and measure the sub-aperture. There is a partial overlap area between the divided adjacent subapertures. The white light interferometer measures each sub-aperture in turn. The second step is edge feature detection. There are highly steep edge features between the bottom of the groove and the surface of the surface microgroove. The stitching algorithm detects edge features by detecting the slope threshold of the sub-aperture. The third step is to correct the abscissa. Project the detected edge feature data onto the OXY plane to generate a 2D data set. The multi-dimensional motion scanning platform inevitably has motion errors in the measurement process, so the edge characteristic curves of adjacent sub-apertures have obvious lateral displacement in the overlapping area. The lateral displacement and angle of the lateral coordinate of each sub-aperture are corrected by the least square method. The fourth step is the height coordinate correction. The stitching algorithm minimizes the height difference between the corresponding points in the overlapping area, and solves it with a linear least squares problem model. We have completed the measurement of the fringe pattern on the computer-generated hologram (CGH) substrate and the complete topography of the long groove on the 10mm hemisphere. After the sub-aperture global iterative stitching algorithm, there is no stitching trace in the simulation result. For the long groove on the hemisphere, we designed a four-dimensional scanning motion platform and a special fixture to ensure that the long groove on the hemisphere rotates around an axis perpendicular to the geodesic line. The center of the white light interference fringe is always at the center of the long slot aperture.

Proceedings Article | 27 March 2022 Paper

High-resolution white light scanning stitching measurement of full-surface microstructure

Jingyang Guo, Dede Zhai, Shanyong Chen, Wenwen Lu

Proceedings Volume 12169, 12169BE (2022) https://doi.org/10.1117/12.2626853

KEYWORDS: Edge detection, Spherical lenses, Interferometers, Microscopes, Computer generated holography, Optical testing, Motion measurement, Microscopy, Computer simulations, Optical interferometry

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Proceedings Article | 16 January 2019 Paper

Interferometric test of optical free-form window

Chuanchao Wu, Shanyong Chen, Shuai Xue, Dede Zhai

Proceedings Volume 10838, 108381D (2019) https://doi.org/10.1117/12.2506124

KEYWORDS: Wavefronts, Interferometry, Optical analysis, Optical testing, Ray tracing, Collimation, Optical components, Modulation, Geometrical optics, Interferometers

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Proceedings Article | 27 September 2016 Paper

A new multi-probe scanning method for measuring optical surface

Dede Zhai, Ziqiang Yin, Shanyong Chen, Fujing Tian

Proceedings Volume 9684, 96841K (2016) https://doi.org/10.1117/12.2243800

KEYWORDS: Sensors, Error analysis, Metrology, Systems modeling, Mathematical modeling, Defense technologies, Motion measurement, 3D metrology, Autocollimators, Computer simulations

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