Dr. Derek Bassett
at Tokyo Electron America Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 March 2012 Paper
Proceedings Volume 8325, 83250K (2012) https://doi.org/10.1117/12.916310
KEYWORDS: Extreme ultraviolet, Extreme ultraviolet lithography, Finite element methods, Capillaries, Polymers, Line width roughness, Neodymium, Polymer thin films, Protactinium, Semiconducting wafers

Proceedings Article | 21 March 2006 Paper
Proceedings Volume 6154, 61544P (2006) https://doi.org/10.1117/12.656482
KEYWORDS: Semiconducting wafers, Microfluidics, Photomasks, Polymers, Glasses, Immersion lithography, Photoresist materials, Dewetting, Reflection, Scanners

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