Devendra Joshi
Director/Engineering at Cadence Design Systems Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 27 December 2002 Paper
Proceedings Volume 4889, (2002) https://doi.org/10.1117/12.467847
KEYWORDS: Photomasks, Lithography, Semiconducting wafers, Process modeling, Optical proximity correction, Manufacturing, Computed tomography, Inspection, Silicon, Optics manufacturing

Proceedings Article | 30 July 2002 Paper
Proceedings Volume 4691, (2002) https://doi.org/10.1117/12.474575
KEYWORDS: Photomasks, Lithography, Error analysis, Manufacturing, Monte Carlo methods, Field effect transistors, Optical lithography, Semiconducting wafers, Resolution enhancement technologies, Lithographic illumination

Proceedings Article | 14 September 2001 Paper
Proceedings Volume 4346, (2001) https://doi.org/10.1117/12.435693
KEYWORDS: Metals, Field effect transistors, Critical dimension metrology, Transistors, Integrated optics, Optical proximity correction, Silicon, Cadmium, Optical simulations, Resistance

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