Prof. Dietmar Knipp
at Jacobs Univ Bremen
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 27 May 2011 Paper
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Aspheric lenses, Ray tracing, Wavefront aberrations, Profilometers, Wavefronts, Optical design, Refractive index, Optical testing, Optical components, Refraction

Proceedings Article | 17 June 2009 Paper
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Wavefronts, Aspheric lenses, Monochromatic aberrations, Sensors, Light sources, Zernike polynomials, Inspection, Wavefront analysis, Optical aberrations, Cameras

Proceedings Article | 21 January 2003 Paper
Proc. SPIE. 4983, MOEMS and Miniaturized Systems III
KEYWORDS: Sensors, Spectroscopy, Mirrors, Modulation, Amorphous silicon, Photoresistors, Absorption, Reflection, Glasses, Thin films

Proceedings Article | 21 December 2001 Paper
Proc. SPIE. 4466, Organic Field Effect Transistors
KEYWORDS: Silicon, Oxides, Silicon films, Dielectrics, Crystals, Transistors, Thin films, Amorphous silicon, Chemical vapor deposition, X-ray diffraction

Proceedings Article | 15 May 2001 Paper
Proc. SPIE. 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
KEYWORDS: Sensors, Diodes, Absorption, Thin films, Photons, Switching, Transparent conductors, Amorphous silicon, Signal detection, Optical filters

Showing 5 of 9 publications
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