Dr. Dipankar Pramanik Profile

Dr. Dipankar Pramanik

Senior Director at Synopsys Inc

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Publications (6)

Proceedings Article | 10 July 2003 Paper

Optimizing manufacturability for the 65-nm process node

Dipankar Pramanik, Michel Cote

Proceedings Volume 5042, (2003) https://doi.org/10.1117/12.485248

KEYWORDS: Photomasks, Manufacturing, Phase shifts, Phase shifting, Optical proximity correction, Lithography, Image processing, 193nm lithography, Fabrication, Image processing software

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Proceedings Article | 10 July 2003 Paper

Assessing technology options for 65-nm logic circuits

Dipankar Pramanik, Michel Cote, Kevin Beaudette, Valery Axelrad

Proceedings Volume 5042, (2003) https://doi.org/10.1117/12.485256

KEYWORDS: Transistors, Manufacturing, Lithography, Logic, Critical dimension metrology, Device simulation, Resolution enhancement technologies, Photomasks, Oxides, 193nm lithography

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Proceedings Article | 10 July 2003 Paper

Lithography-driven layout of logic cells for 65-nm node

Dipankar Pramanik, Michel Cote

Proceedings Volume 5042, (2003) https://doi.org/10.1117/12.485349

KEYWORDS: Phase shifts, Manufacturing, Transistors, Photomasks, Lithography, Diffusion, Resolution enhancement technologies, Image processing, Silicon, Metals

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Proceedings Article | 2 July 2003 Paper

Cost-effective strategies for ASIC masks

Dipankar Pramanik, Henry Kamberian, Christopher Progler, Michael Sanie, David Pinto

Proceedings Volume 5043, (2003) https://doi.org/10.1117/12.485280

KEYWORDS: Photomasks, Semiconducting wafers, Lithography, Reticles, Optical proximity correction, Manufacturing, Dysprosium, Inspection, Critical dimension metrology, Defect inspection

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Proceedings Article | 4 September 1998 Paper

Optimized shallow trench isolation for sub-0.18-um ASIC technologies

Faran Nouri, Olivier Laparra, Harlan Sur, Samar Saha, Dipankar Pramanik, Martin Manley

Proceedings Volume 3506, (1998) https://doi.org/10.1117/12.323962

KEYWORDS: Oxides, Chemical mechanical planarization, Silicon, Semiconducting wafers, Etching, Diodes, Transistors, Polishing, Plasma, Oxidation

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Showing 5 of 6 publications

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