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Dipendra Adhikari
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Publications (1)
Proceedings Article | 14 March 2013 Paper
Low-temperature characterization of a 1.55-µm multiple-quantum-well laser down to 10 K
Proceedings Volume 8619, 861913 (2013) https://doi.org/10.1117/12.2010029
KEYWORDS: Temperature metrology, Resistance, Transparency, Semiconductor lasers, Laser damage threshold, Cryogenics, Diodes, Data modeling, Laser applications, Optics manufacturing
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