Dirk Thiele
at Carl Zeiss AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2019 Paper
Stefan Richter, Carsten Wehe, Uwe Wolf, Thomas Nobis, Lars-Christian Wittig, Philipp Huebner, Alexander Froeber, Gerhard Krampert, Dirk Thiele, Joerg Muetze, Michael Kempe
Proceedings Volume 10931, 109310K (2019) https://doi.org/10.1117/12.2514552
KEYWORDS: Mirrors, Confocal microscopy, Microelectromechanical systems, Imaging systems, Control systems, Microscopes, Field programmable gate arrays, Laser scanners

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