Dr. Dirk Weiler
Head of Department at Fraunhofer-IMS
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 20 September 2020 Presentation + Paper
Proc. SPIE. 11537, Electro-Optical and Infrared Systems: Technology and Applications XVII
KEYWORDS: Readout integrated circuits, Microbolometers, Nanotechnology, Microsystems, Manufacturing, Resistance, Black bodies, Electro optics, Digital electronics, Nanolithography

Proceedings Article | 9 October 2018 Paper
Proc. SPIE. 10795, Electro-Optical and Infrared Systems: Technology and Applications XV
KEYWORDS: Readout integrated circuits, Microbolometers, Thermography, Sensors, Black bodies, Infrared radiation, Semiconducting wafers, Temperature metrology

Proceedings Article | 29 May 2018 Presentation + Paper
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Amorphous silicon, Readout integrated circuits, Microbolometers, Antireflective coatings, Sensors, Interfaces, Black bodies, Analog electronics, Semiconducting wafers, Temperature metrology

Proceedings Article | 20 May 2016 Paper
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Readout integrated circuits, Microbolometers, Reflectors, Resistance, Optical resonators, Infrared radiation, Electro optics, Semiconducting wafers, Nanolithography, Absorption

Proceedings Article | 24 June 2014 Paper
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Amorphous silicon, Bolometers, Packaging, Readout integrated circuits, Microbolometers, Thermography, Sensors, Electro optics, Semiconducting wafers, Absorption

Showing 5 of 8 publications
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