Dr. Dmitry Shefer
at Eindhoven Univ of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12953, 129530E (2024) https://doi.org/10.1117/12.3009896
KEYWORDS: Particles, Plasma, Electrons, Adhesion, Scanners, Hydrogen, Extreme ultraviolet lithography, Ions, Stochastic processes, Particle contamination

Proceedings Article | 22 February 2021 Poster + Presentation + Paper
Proceedings Volume 11609, 116091F (2021) https://doi.org/10.1117/12.2581666
KEYWORDS: Plasma, Particles, Hydrogen, Tin, Lead, Extreme ultraviolet lithography, Ions, Semiconducting wafers, Reticles, Extreme ultraviolet

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