Dr. Douglas Holmgren
Senior Member/Technical Staff at Applied Materials Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 October 2003 Paper
Proc. SPIE. 5220, Nanofabrication Technologies
KEYWORDS: Photomasks, Lithography, Raster graphics, Electron beam lithography, Mask making, Modulation, Prototyping, Electron beams, Semiconducting wafers, Laser applications

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