Dr. Eric Rosas
President at Cluster Mexicano de Fotonica
SPIE Involvement:
Author | Editor
Area of Expertise:
Optical Metrology , Lasers , Photometry , Radiometry , Solid-State Lighting , Education in Optics & Photonics
Profile Summary

Eric ROSAS. Dr. Sc.(Optics) by the Universidad de Guanajuato (1998) and B. Sc. (Physics) by the Universidad Autónoma del Estado de México (1994).

President of the Clúster Mexicano de Fotónica, General Chair of the Mexican Photonics Initiative and 2017-2020 Appointed Vice President within the International Commission for Optics.

He has worked in ESR for gamma ray dosimetry, Doppler-free saturation spectroscopy, laser resonators dynamics, diode-pumped solid-state lasers, holographic laser resonators, and primary photometry and radiometry.

He has served as 2014-2017 Appointed Vice President at the International Commission for Optics; Member of the 2015-2017 International Council of The Optical Society; 2012-2014 President of the División de Óptica of the Sociedad Mexicana de Física; 2010-2013 President of the Red Iberoamericana de Óptica; and 2008-2010 President of the Academia Mexicana de Óptica and also of the Comité Territorial de Óptica de México of the International Commission for Optics.
Publications (11)

Proceedings Article | 25 October 2011 Paper
Proc. SPIE. 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World
KEYWORDS: Metrology, Light emitting diodes, Sensors, Calibration, Solid state lighting, Spectroscopy, Manufacturing, Control systems, Spherical lenses, Temperature metrology

Proceedings Article | 15 October 2011 Paper
Proc. SPIE. 8287, Eighth Symposium Optics in Industry
KEYWORDS: Metrology, Statistical analysis, Sensors, Calibration, Error analysis, Ions, Lamps, Head, Diffusers, Photometry

Proceedings Article | 15 October 2011 Paper
Proc. SPIE. 8287, Eighth Symposium Optics in Industry
KEYWORDS: Optical fibers, Metrology, Modulation, Calibration, Dispersion, Phase shift keying, Optical testing, Telecommunications, Picosecond phenomena, Network security

Proceedings Article | 3 December 2009 Paper
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Metrology, Light emitting diodes, LED lighting, Solid state lighting, Lamps, Colorimetry, Solids, Light sources and illumination, Photometry, Luminous efficacy

Proceedings Article | 3 December 2009 Paper
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Optical filters, Metrology, Calibration, Error analysis, Lamps, Solids, Light sources and illumination, Transmittance, Absorbance, Light wave propagation

Showing 5 of 11 publications
Proceedings Volume Editor (3)

SPIE Conference Volume | 11 October 2011

SPIE Conference Volume | 25 November 2009

SPIE Conference Volume | 31 January 2006

Conference Committee Involvement (4)
Eighth Symposium Optics in Industry
9 September 2011 | Toluca de Lerdo, Mexico
Eighth Symposium Optics in Industry
9 September 2011 | Toluca de Lerdo, Mexico
Seventh Symposium on Optics in Industry
11 September 2009 | Guadalajara, Jalisco, Mexico
Fifth Symposium Optics in Industry
8 September 2005 | Santiago De Queretaro, Mexico
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