Dr. Guru Prasad A. S.
Advanced Technologist at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 13 June 2017 Paper
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Speckle, Calibration, Error analysis, Surface roughness, Speckle pattern, Optical metrology, Machine vision, Optical resolution, Laser metrology, Laser optics

Proceedings Article | 13 June 2017 Paper
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Statistical analysis, Speckle, Calibration, Inspection, Surface roughness, Nondestructive evaluation, Additive manufacturing, Speckle pattern, Speckle metrology, Radium

Proceedings Article | 13 June 2017 Paper
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Metrology, Speckle, Image processing, Manufacturing, Surface roughness, Nondestructive evaluation, Optical metrology, Laser metrology, Optics manufacturing, Surface finishing

Proceedings Article | 11 November 2016 Paper
Proc. SPIE. 10150, Second International Seminar on Photonics, Optics, and Its Applications (ISPhOA 2016)
KEYWORDS: GRIN lenses, Metrology, Imaging systems, Speckle, Lenses, Distortion, Speckle metrology, Objectives, Modulation transfer functions, Speckle imaging

Proceedings Article | 17 July 2015 Paper
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Metrology, Speckle, Image processing, Inspection, Surface roughness, Nondestructive evaluation, Feature extraction, Speckle pattern, Optical engineering, Speckle imaging

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