Ms. E. Zhang Profile

E. Zhang

at Hebei Univ of Technology

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 19 December 2013 Paper

Fluctuation elimination of fringe pattern by using empirical mode decomposition

Zonghua Zhang, E. Zhang

Proceedings Volume 9046, 90460D (2013) https://doi.org/10.1117/12.2034364

KEYWORDS: Fringe analysis, Phase shifts, Digital Light Processing, Projection systems, CCD cameras, Computer simulations, Phase shift keying, Signal processing, Imaging systems, 3D metrology

Read Abstract +

As one of the most important direction of non-contact 3D shape measuring method, optical technology has been widely applied in the fields of industrial production, automatic detection, quality control, machine vision, cultural preservation, and so on. With the advent and development of high performance devices such as DLP (Digital Light Processing) projector and CCD camera, digital fringe pattern projection techniques have become a rapidly developing area. However, when four-step phase-shifting algorithm is used to calculate the wrapped phase, the intensity fluctuation of the captured fringe patterns may affect the accuracy of the final measurement results. This paper presents a novel method to eliminate the intensity fluctuation of the captured fringe patterns by using EMD (Empirical Mode Decomposition) algorithm. Four fringe patterns which have pi/2 phase shift in between need to be captured for four-step phase-shifting algorithm. In order to eliminate the intensity fluctuation between fringe patterns, every fringe pattern is decomposed into a number of IMFs (Intrinsic Mode Function) by using EMD. After being processed, the four fringe patterns have the same background light intensity and contrast. Both simulated and experimental data are tested to verify the validity of the proposed method. The results show that the intensity fluctuation between fringe patterns can be effectively eliminated to give accurate phase data.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years