Dr. Edmund K. Banghart
Semiconductor Device Physics & Simulation
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 February 2006 Paper
Proceedings Volume 6069, 606902 (2006) https://doi.org/10.1117/12.651672
KEYWORDS: Microlens, Quantum efficiency, Image sensors, Charge-coupled devices, Oxides, CCD image sensors, Sensors, Optical filters, Cameras, Metals

Proceedings Article | 28 April 2005 Paper
Proceedings Volume 5722, (2005) https://doi.org/10.1117/12.591143
KEYWORDS: Charge-coupled devices, Electrons, Process modeling, Instrument modeling, TCAD, 3D modeling, Imaging systems, Clocks, Doping, Image processing

Proceedings Article | 23 February 2005 Paper
Edmund Banghart, Eric Stevens, Hung Doan, John Shepherd, Eric Meisenzahl
Proceedings Volume 5678, (2005) https://doi.org/10.1117/12.594402
KEYWORDS: Electrodes, Charge-coupled devices, Imaging systems, Doping, Dielectrics, Silicon, Data modeling, Numerical simulations, Arsenic, Oxidation

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