Dr. Edward F. Kelley Profile

Dr. Edward F. Kelley

Physicist

SPIE Involvement:

Author

Proceedings Article | 21 March 2007 Paper

Accurate color measurement methods for medical displays

Anindita Saha, Hongye Liang, Aldo Badano, Edward Kelley

Proceedings Volume 6516, 651612 (2007) https://doi.org/10.1117/12.708998

KEYWORDS: Light emitting diodes, LCDs, Contamination, Spectroscopy, Stray light, Green light emitting diodes, Standards development, Laser beam diagnostics, Medical imaging, Distance measurement

Read Abstract +

Proceedings Article | 10 April 2005 Paper

Comparing methodologies for determining resolution from contrast in projection display systems

Paul Boynton, Edward Kelley

Proceedings Volume 5740, (2005) https://doi.org/10.1117/12.602371

KEYWORDS: Stray light, Projection systems, Modulation, CCD cameras, Sensors, Image resolution, Displays, Standards development, Modulation transfer functions, Spatial resolution

Read Abstract +

Proceedings Article | 28 May 2004 Paper

Projection display metrology at NIST: measurements and diagnostics

Paul Boynton, Edward Kelley, John Libert

Proceedings Volume 5289, (2004) https://doi.org/10.1117/12.527093

KEYWORDS: Standards development, Sensors, Metrology, Stray light, Projection systems, Electronics, Diagnostics, Calibration, Light scattering, Reflection

Read Abstract +

Proceedings Article | 10 September 2003 Paper

Liquid-filled camera for the measurement of high-contrast images

Paul Boynton, Edward Kelley

Proceedings Volume 5080, (2003) https://doi.org/10.1117/12.519602

KEYWORDS: Cameras, Liquids, Glasses, Surface conduction electron emitter displays, Charge-coupled devices, CCD cameras, Particles, Light scattering, Optical filters, Scattering

Read Abstract +

Proceedings Article | 8 August 2003 Paper

Color gamut assessment standard: construction, characterization, and interlaboratory measurement comparison

John Libert, Edward Kelley, Paul Boynton, Steven Brown, Christine Wall, Colin Campbell

Proceedings Volume 4826, (2003) https://doi.org/10.1117/12.514538

Read Abstract +

In earlier papers, NIST proposed a standard illumination source and optical filter targets with which to assess the state-of-the-art of display measurement. The Display Measurement Assessment Transfer Standard (DMATS) was designed to present the display metrologist with a rectangular array of targets such as color filters, polarizers, and grilles, back-lighted by uniform illumination, to be measured using methods and instruments typically used in display performance measurement. A “round robin” interlaboratory measurement exercise using the “standard” artifact suite would enable a first order assessment of display measurement reproducibility, i.e., measurement variability within the electronic display community. The rectangular array design of the DMATS was anticipated to present stray light and color contamination challenges to facilitate identification of error sources deriving from measurement protocols, laboratory environment, and equipment. However, complications in dealing with heating problems threatened to delay the planned laboratory intercomparison. The Gamut Assessment Standard (GAS) was thus designed as an interim solution to enable the NIST scientists and participating measurement laboratories to begin collecting data. The GAS consists of a 150 mm diameter integrating sphere standard illumination source with a stray light elimination tube (SLET) mounted at the exit port. A dual six-position filter wheel is mounted at the SLET exit port. One wheel holds a series of neutral density filters and a second interchangeable wheel holds various color filters. This paper describes the design and construction of the GAS, its initial performance characterization by NIST, and comparison measurements made at NPL. Possible design changes suggested by the results of the preliminary intercomparison are discussed, as are plans for future interlaboratory comparisons and potential use of the GAS as a transfer standard for laboratory self-certification.

Proceedings Article | 8 August 2003 Paper

Current projects in display metrology at the NIST flat panel display laboratory

Paul Boynton, Edward Kelley, John Libert

Proceedings Volume 4826, (2003) https://doi.org/10.1117/12.514542

Read Abstract +

Proceedings Article | 26 April 2002 Paper

Stray light compensation in small area contrast measurements of projection displays

Paul Boynton, Edward Kelley

Proceedings Volume 4657, (2002) https://doi.org/10.1117/12.463788

KEYWORDS: Stray light, Projection systems, CCD cameras, Reflectivity, Environmental sensing, Head, Optical testing, Charge-coupled devices, Modulation, Standards development

Read Abstract +

Proceedings Article | 18 June 2001 Paper

Electronic display metrology: not a simple matter

Edward Kelley

Proceedings Volume 4450, (2001) https://doi.org/10.1117/12.431252

KEYWORDS: Metrology, Reflection, Stray light, Air contamination, Projection systems, Eye, Sensors, Manufacturing, Reflective displays, Flat panel displays

Read Abstract +

Proceedings Article | 30 April 2001 Paper

Light-measuring device diagnostics for the photometric and colorimetric measurement of flying-spot displays

Paul Boynton, Edward Kelley

Proceedings Volume 4295, (2001) https://doi.org/10.1117/12.424877

KEYWORDS: Diagnostics, Photodiodes, Optical spheres, Lamps, Integrating spheres, Optical filters, Calibration, Xenon, Optical filtering, Projection systems

Read Abstract +

Proceedings Article | 30 April 2001 Paper

Standard illumination source for the evaluation of display measurement methods and instruments

John Libert, Paul Boynton, Edward Kelley, Steven Brown, Yoshihiro Ohno, Farshid Manoocheri

Proceedings Volume 4295, (2001) https://doi.org/10.1117/12.424882

KEYWORDS: Optical filters, Calibration, Prototyping, Standards development, Metrology, Stray light, Visible radiation, Environmental sensing, Diagnostics, Display technology

Read Abstract +

Proceedings Article | 30 April 2001 Paper

Measurements of static noise in display images

John Roberts, Edward Kelley

Proceedings Volume 4295, (2001) https://doi.org/10.1117/12.424874

KEYWORDS: Charge-coupled devices, Cameras, CCD cameras, Spatial frequencies, Digital cameras, Flat panel displays, Metrology, Optical testing, Imaging systems, Stray light

Read Abstract +

Proceedings Article | 25 April 2000 Paper

Diagnostics for light-measuring devices in flying-spot display measurements

Paul Boynton, Edward Kelley, Susan Highnote, Randy Hurtado

Proceedings Volume 3954, (2000) https://doi.org/10.1117/12.383383

KEYWORDS: Diagnostics, Projection systems, LCDs, Xenon, Laser based displays, Optical testing, Sensors, Lamps, Reflectivity, Mirrors

Read Abstract +

Proceedings Article | 12 April 1999 Paper

Stray light elimination in making projection display measurements

Paul Boynton, Edward Kelley

Proceedings Volume 3636, (1999) https://doi.org/10.1117/12.344651

KEYWORDS: Projection systems, Stray light, Reflectivity, Standards development, Optical testing, Light, Reflection, Sensors, Light sources, Image sensors

Read Abstract +

Proceedings Article | 12 April 1999 Paper

Simulated-eye-design camera for high-contrast measurements

Edward Kelley

Proceedings Volume 3636, (1999) https://doi.org/10.1117/12.344645

KEYWORDS: Cameras, Liquids, Charge-coupled devices, Surface conduction electron emitter displays, CCD cameras, Optical filters, Glasses, Particles, Imaging systems, Device simulation

Read Abstract +

Proceedings Article | 1 April 1994 Paper

Research on flat panel display measurements at the National Institute of Standards and Technology

Bruce Field, Edward Kelley, Charles Fenimore, Herbert Bennett

Proceedings Volume 2174, (1994) https://doi.org/10.1117/12.172156

KEYWORDS: Standards development, Flat panel displays, Video, Computing systems, Manufacturing, Video processing, Robotic systems, Calibration, Electronics, Visualization

Read Abstract +

Showing 5 of 15 publications

SPIE Conference Volume | 30 April 2001

Flat Panel Display Technology and Display Metrology II

SPIE Conference Volume | 30 April 2001

Flat Panel Display Technology and Display Metrology II

SPIE Conference Volume | 12 April 1999

Flat Panel Display Technology and Display Metrology

Conference Committee Involvement (3)

Display Metrology II

23 January 2001 | San Jose, CA, United States

Flat Panel Display Technology and Display Metrology II

22 January 2001 | San Jose, CA, United States

Flat Panel Display Technology and Display Metrology

27 January 1999 | San Jose, CA, United States

Keywords/Phrases

Search In:

Publication Years