Dr. Edward W. Reutzel
Head of LPT Dept at Applied Research Lab
SPIE Involvement:
Conference Program Committee | Author | Editor
Publications (7)

Proceedings Article | 24 April 2020 Presentation
Proc. SPIE. 11381, Health Monitoring of Structural and Biological Systems XIV
KEYWORDS: Titanium, Interferometers, Metals, Nd:YAG lasers, Surface roughness, Nondestructive evaluation, Ultrasonics, Directed energy weapons, Additive manufacturing, Q switched lasers

Proceedings Article | 6 April 2016 Paper
Proc. SPIE. 9738, Laser 3D Manufacturing III
KEYWORDS: Imaging systems, Cameras, Calibration, Image processing, Directed energy weapons, Additive manufacturing, Pyrometry, Sensing systems, Laser optics, Temperature metrology

Proceedings Article | 14 May 2015 Paper
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Infrared cameras, Cameras, Sensors, Metals, Image processing, Control systems, 3D modeling, Additive manufacturing, Process control, Laser systems engineering

Proceedings Article | 16 September 2013 Paper
Proc. SPIE. 8826, Laser Material Processing for Solar Energy Devices II
KEYWORDS: Silica, Solar cells, Silicon, Laser processing, Resistance, Fiber lasers, Semiconductor lasers, Aluminum, Semiconducting wafers, Pulsed laser operation

Proceedings Article | 15 October 2012 Paper
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Silicon, Laser processing, Resistance, Diagnostics, Doping, Diodes, Aluminum, Semiconducting wafers, Pulsed laser operation

Showing 5 of 7 publications
Proceedings Volume Editor (5)

Conference Committee Involvement (7)
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Laser Processing and Fabrication for Solar, Displays, and Optoelectronic Devices III
20 August 2014 | San Diego, California, United States
Showing 5 of 7 Conference Committees
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