Dr. Edward J. Wollack
Research Astrophysicis at NASA Goddard Space Flight Ctr
SPIE Involvement:
Author
Area of Expertise:
Astronomical Instrumentation , Optical Systems , Metamaterials , Sensors
Publications (96)

Proceedings Article | 10 October 2019 Presentation + Paper
Proc. SPIE. 11151, Sensors, Systems, and Next-Generation Satellites XXIII
KEYWORDS: Aerospace engineering, Calibration, Remote sensing, Silicon, Light scattering, Reflectivity, Coronagraphy, Exoplanets, Optical testing, Bidirectional reflectance transmission function

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11116, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II
KEYWORDS: Etching, Silicon, Reflectivity, Coronagraphy, Exoplanets, Bidirectional reflectance transmission function, Photomasks, Reactive ion etching, Semiconducting wafers, Cryogenics

Proceedings Article | 29 May 2019 Paper
Proc. SPIE. 10927, Photonic and Phononic Properties of Engineered Nanostructures IX
KEYWORDS: Bolometers, Gold, Electron beam lithography, Optical filters, Sensors, Etching, Silicon, Deep reactive ion etching, Niobium, Semiconducting wafers

Proceedings Article | 15 August 2018 Paper
Proc. SPIE. 10708, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX
KEYWORDS: Telescopes, Cameras, 3D modeling, Optical testing, Ray tracing, Optical simulations, Solid modeling

Proceedings Article | 6 August 2018 Paper
Proc. SPIE. 10708, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX
KEYWORDS: Optical components, Reflectors, Telescopes, Polarization, Cameras, Sensors, Reflectivity, Physics, Optical simulations, Geometrical optics

Showing 5 of 96 publications
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