Dr. Seyed Ehsan Hashemi
SPIE Involvement:
Author
Area of Expertise:
Optoelectronics , Photonics
Publications (6)

Proceedings Article | 16 February 2020 Presentation + Paper
Tsu-Chi Chang, Ehsan Hashemi, Jörgen Bengtsson, Johan Gustavsson, Åsa Haglund, Tien-Chang Lu
Proceedings Volume 11280, 112800M (2020) https://doi.org/10.1117/12.2545315
KEYWORDS: Vertical cavity surface emitting lasers, Titanium dioxide, Reflectivity, Gallium nitride, Reflectors, Dielectrics, Mirrors, Dielectric polarization, Refractive index, Optical design

Proceedings Article | 21 February 2018 Paper
Proceedings Volume 10542, 105420T (2018) https://doi.org/10.1117/12.2289318
KEYWORDS: Vertical cavity surface emitting lasers, Reflectivity, Gallium nitride, Titanium dioxide, Reflectors, Optical pumping, Scanning electron microscopy, Photomasks, Mirrors, Ultraviolet radiation

Proceedings Article | 16 February 2017 Presentation + Paper
Filip Hjort, Ehsan Hashemi, David Adolph, Tommy Ive, Åsa Haglund
Proceedings Volume 10104, 1010413 (2017) https://doi.org/10.1117/12.2250126
KEYWORDS: Resistance, Zinc oxide, Distributed Bragg reflectors, Gallium nitride, Vertical cavity surface emitting lasers, Molecular beam epitaxy, Doping, Refractive index, Mirrors, Reflectivity, Polarization, Aluminum

Proceedings Article | 28 April 2016 Open Access Paper
Å. Haglund, E. Hashemi, J. Bengtsson, J. Gustavsson, M. Stattin, M. Calciati, M. Goano
Proceedings Volume 9892, 98920Y (2016) https://doi.org/10.1117/12.2229428
KEYWORDS: Vertical cavity surface emitting lasers, Mirrors, Reflectivity, Gallium nitride, Titanium dioxide, Vertical cavity surface emitting lasers, Gallium nitride, Quantum wells, Dielectrics, Refractive index, Absorption, Etching

Proceedings Article | 27 February 2015 Paper
Ehsan Hashemi, Jörgen Bengtsson, Johan Gustavsson, Stefan Carlsson, Georg Rossbach, Åsa Haglund
Proceedings Volume 9372, 93720D (2015) https://doi.org/10.1117/12.2078951
KEYWORDS: Silica, Etching, Vertical cavity surface emitting lasers, Dielectrics, Semiconducting wafers, Silicon, Nickel, Dielectric polarization, Reflectivity, Titanium dioxide

Showing 5 of 6 publications
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