Elena Donini
at Fondazione Bruno Kessler
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 October 2019 Presentation + Paper
Proc. SPIE. 11155, Image and Signal Processing for Remote Sensing XXV
KEYWORDS: Radar, Modeling, Visual process modeling, Data modeling, Reflection, Dielectrics, Optical inspection, Data acquisition, Associative arrays, Process modeling

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