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Emmanuel Mercado Sotelo
Research Assistant at Univ of New Mexico
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Author
Area of Expertise:
Semiconductor laser characterization , Electrical/optical instrumentation , Test systems engineering , Test process support engineering , Telecommunications , Statistical process control
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Profile Summary
Multidisciplinary professional with broad experience in the fields of test systems engineering, test process support engineering, software systems engineering and telecommunications electronic products manufacturing and improvement always interested in solving challenging problems.
Publications (1)
Proceedings Article | 14 March 2013 Paper
Low-temperature characterization of a 1.55-µm multiple-quantum-well laser down to 10 K
Proceedings Volume 8619, 861913 (2013) https://doi.org/10.1117/12.2010029
KEYWORDS: Temperature metrology, Resistance, Transparency, Semiconductor lasers, Laser damage threshold, Cryogenics, Diodes, Data modeling, Laser applications, Optics manufacturing
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