Dr. Enrico Masetti Profile

Dr. Enrico Masetti

at ENEA

SPIE Involvement:

Author

Publications (17)

Proceedings Article | 10 June 2004 Paper

Paper

Surface investigation of VUV-optical components after exposure to high-energy synchrotron radiation

Stefan Guenster, Holger Blaschke, Kai Starke, Detlev Ristau, Miltcho Danailov, B. Diviacco, Alexandre Gatto, Norbert Kaiser, Francesca Sarto, Enrico Massetti

Proceedings Volume 5273, (2004) https://doi.org/10.1117/12.525490

KEYWORDS: Transmittance, Vacuum ultraviolet, Oxides, Synchrotron radiation, Optical coatings, Aluminum, Lanthanum, Resistance, Visible radiation, Microscopy

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Proceedings Article | 25 February 2004 Paper

Paper

Low-intensity scatterering detection with commercial spectrophotometers

Enrico Masetti, Anna Krasilnikova, Jiri Bulir, Josep Ferre-Borrul

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.543708

KEYWORDS: Scattering, Interfaces, Light scattering, Optical spheres, Spectrophotometry, Sensors, Refractive index, Scatter measurement, Silica, Reflectivity

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Proceedings Article | 30 May 2003 Paper

Paper

Radiation resistance of optical materials against synchrotron radiation

Stefan Guenster, Holger Blaschke, Detlev Ristau, Alexandre Gatto, Joerg Heber, Norbert Kaiser, B. Diviacco, Marino Marsi, Mauro Trovo, Francesca Sarto, Salvatore Scaglione, Enrico Masetti

Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.473160

KEYWORDS: Vacuum ultraviolet, Synchrotron radiation, Surface finishing, Free electron lasers, Synchrotrons, Resistance, Transmittance, Polishing, Hard x-rays, Reflectivity

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Proceedings Article | 2 November 2000 Paper

Paper

Fast-scanning ellipsometry for thin film characterization

Christopher Berge, Anna Krasilnikova, Enrico Masetti

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405833

KEYWORDS: Sensors, Polarimetry, Optical coatings, Ellipsometry, Thin films, Refractive index, Diffraction gratings, Polarization, Optical properties, Associative arrays

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Proceedings Article | 3 March 2000 Paper

Paper

Laser damage threshold of MgF2 thin films by photoacoustic beam deflection

Maria Protopapa, Maria Perrone, Angela Piegari, Enrico Masetti, Detlev Ristau, Etienne Quesnel, Angela Duparre

Proceedings Volume 3902, (2000) https://doi.org/10.1117/12.379303

KEYWORDS: Laser damage threshold, Magnesium fluoride, Photoacoustic spectroscopy, Laser induced damage, Refractive index, Calcium, Thin films, Silica, Ultraviolet radiation, Surface roughness

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Proceedings Article | 7 September 1999 Paper

Paper

Performances of an electrochromic device based on WO3 oxide and Ce-V mixed oxide thin films

Elvira Bauer, Francesca Varsano, Franco Decker, Enrico Masetti

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360117

KEYWORDS: Oxides, Lithium, Electrodes, Transmittance, Ions, Thin films, Cerium, Thin film devices, Vanadium, Sputter deposition

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Proceedings Article | 7 September 1999 Paper

Paper

UV-optical and microstructural properties of MgF2-coatings deposited by IBS and PVD processes

Detlev Ristau, Winfried Arens, Salvador Bosch, Angela Duparre, Enrico Masetti, Damien Jacob, George Kiriakidis, Francesca Peiro, Etienne Quesnel, Alexander Tikhonravov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360111

KEYWORDS: Silicon, Optical coatings, Reflectivity, Magnesium fluoride, Refractive index, Surface roughness, Sputter deposition, Thin film coatings, Deposition processes, Thin films

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Proceedings Article | 7 September 1999 Paper

Paper

Oxide films made by radio frequency sputtering of solid and powder targets: a comparison

A. Krasilnikova, Enrico Masetti, Francesca Varsano, Elvira Bauer

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360116

KEYWORDS: Refractive index, Sputter deposition, Oxides, Solids, Thin films, Thin film deposition, Water, Absorption, Ceramics, Reflectivity

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Proceedings Article | 7 September 1999 Paper

Paper

New grating photopolarimeter for the ellipsometric characterization of thin films

Enrico Masetti, A. Krasilnikova

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360077

KEYWORDS: Sensors, Diffraction gratings, Polarization, Reflection, Thin films, Polarimetry, Calibration, Diffraction, Autocollimation, Light sources

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Proceedings Article | 7 September 1999 Paper

Paper

Sensitivity of the ellipsometric angles psi and delta to the surface inhomogeneity

Alexander Tikhonravov, Michael Trubetskov, Enrico Masetti, A. Krasilnikova, I. Kochikov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360078

KEYWORDS: Refractive index, Statistical modeling, Reflection, Thin films, Surface plasmons, Quartz, Data modeling, Quantum wells, Ions, Protactinium

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Proceedings Article | 7 September 1999 Paper

Paper

Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices

Francesca Varsano, A. Krasilnikova, Franco Decker, Enrico Masetti

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360069

KEYWORDS: Oxides, Lithium, Oxygen, Refractive index, Sputter deposition, Ions, Glasses, Vanadium, Electrodes, Optical properties

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Proceedings Article | 14 October 1997 Paper

Paper

Effective medium approximation of the optical properties of electrochromic cerium-titanium oxide compounds

Nik von Rottkay, Terry Richardson, Michael Rubin, J. Slack, Enrico Masetti, G. Dautzenberg

Proceedings Volume 3138, (1997) https://doi.org/10.1117/12.279205

KEYWORDS: Oxides, Cerium, Titanium, Data modeling, Optical properties, Lithium, Refractive index, Dielectrics, Thin films, Sputter deposition

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Proceedings Article | 8 November 1996 Paper

Paper

Morphological and optical parameters of laser created hydroxyapatite layers

Enrico Masetti, Miroslav Jelinek, Christos Grivas

Proceedings Volume 2965, (1996) https://doi.org/10.1117/12.257369

KEYWORDS: Refractive index, Titanium, Laser optics, Scanning electron microscopy, Inverse optics, Coating, Crystals, Ellipsometry, Data modeling, Spectroscopic ellipsometry

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Proceedings Article | 19 August 1996 Paper

Paper

Thermal conductivity of e-beam and IBS coatings

M. Grilli, T. Aumann, Detlev Ristau, Manfred Dieckmann, Ferdinand von Alvensleben, Enrico Masetti

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246766

KEYWORDS: Signal detection, Optical coatings, Sensors, Crystals, Disk lasers, Resistance, Laser crystals, Absorption, Thin films, Pulsed laser operation

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Proceedings Article | 4 November 1994 Paper

Paper

Tungsten trioxide films during cation insertion: in situ optical characterization

Enrico Masetti, Danilo Dini, Franco Decker

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192169

KEYWORDS: Sodium, Lithium, Ions, Diffusion, Reflectivity, Transmittance, Tungsten, Absorbance, Refractive index, Electrodes

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Proceedings Article | 1 August 1990 Paper

Paper

Optical characterization of low-absorbing thin films in the visible and infrared spectrum

Enrico Masetti, Angela Piegari, A. Tirabassi

Proceedings Volume 1270, (1990) https://doi.org/10.1117/12.20371

KEYWORDS: Thin films, Infrared radiation, Reflectivity, Transmittance, Zinc, Visible radiation, Refractive index, Glasses, Germanium, Inverse optics

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Proceedings Article | 1 August 1990 Paper

Paper

Recent improvements in PDS technique for low-absorption measurements

Marco Montecchi, Enrico Masetti, Gabriele Emiliani

Proceedings Volume 1270, (1990) https://doi.org/10.1117/12.20370

KEYWORDS: Liquids, Laser beam diagnostics, Coating, Refractive index, Thin films, Thermography, Laser scattering, Multilayers, Beam splitters, Thin film coatings

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Showing 5 of 17 publications

Conference Committee Involvement (1)

Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies

3 August 2003 | San Diego, California, United States

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