Eran Socher
at Technion-Israel Inst Tech
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 January 2003 Paper
Eran Socher, Yehuda Sinai, Ofir Bochobza-Degani, Yael Nemirovsky
Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.468669
KEYWORDS: Sensors, CMOS sensors, Thermoelectric materials, Micromachining, Etching, Thermal modeling, Resistance, Silicon, CMOS technology, Standards development

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