Dr. Eric Logean
Optical System Engineer & Laser Safety Officer at Safran Vectronix
SPIE Involvement:
Author
Area of Expertise:
Optical system design , adaptive optics , physiological optics , micro-optics , synthetic holography , laser Doppler velocimetry
Profile Summary

Eric Logean received his diploma in Electrical Engineering from the Technical Institute of Sion, Switzerland, in 1993 (HES-SO). From 1995 to 2004, he was an engineer with the Optics and Biophysics Laboratory at the Institute of Research in Ophthalmology in Sion, Switzerland, developing laser Doppler instruments for retinal blood flow measurements. In 1997, he was visiting the Applied Optics Group at the University of Tsukuba, Japan, where he designed and fabricated synthetic holograms. In 2004, he became a graduate research assistant with the Applied Optics Group at the National University of Ireland in Galway from where he received his PhD degree in Physics in 2009 for his work on retinal imaging using adaptive optics. Since then, he is a scientist at the Ecole Polytechnique Fédérale de Lausanne working in micro-optics design.
Publications (4)

SPIE Journal Paper | 31 January 2014
Benedetto Falsini, Charles Riva, Tommaso Salgarello, Eric Logean, Alberto Colotto, Andrea Giudiceandrea
OE, Vol. 53, Issue 06, 061706, (January 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.6.061706
KEYWORDS: Colorimetry, Blood circulation, Optic nerve, Head, Doppler effect, Eye, Modulation, Mercury, Cameras, Optical engineering

SPIE Journal Paper | 1 July 2013 Open Access
OE, Vol. 52, Issue 07, 075101, (July 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.7.075101
KEYWORDS: Monochromatic aberrations, Objectives, Image sensors, Image quality, Sensors, Semiconducting wafers, Modulation transfer functions, Satellites, Wafer-level optics, Miniature imaging systems

Proceedings Article | 7 March 2013 Paper
Proceedings Volume 8667, 86671E (2013) https://doi.org/10.1117/12.2004390
KEYWORDS: Electroluminescent displays, Objectives, Semiconducting wafers, Sensors, Image sensors, Satellites, Monochromatic aberrations, Satellite imaging, Modulation transfer functions, Imaging systems

Proceedings Article | 18 December 2012 Paper
Proceedings Volume 8550, 85500Q (2012) https://doi.org/10.1117/12.981165
KEYWORDS: Silicon, Quantum cascade lasers, Semiconducting wafers, Mid-IR, Etching, Photoresist processing, Aspheric lenses, Manufacturing, Reactive ion etching, Micro optics

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